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Design of electrical probe memory with TiN capping layer
Wang, Lei, Wen, Jing, Yang, Cihui, Xiong, BangshuLanguage:
english
Journal:
Journal of Materials Science
DOI:
10.1007/s10853-018-2707-4
Date:
July, 2018
File:
PDF, 1.61 MB
english, 2018