Multiple-ellipse fitting method to precisely measure the...

Micron 2018 / 10 Vol. 113

Multiple-ellipse fitting method to precisely measure the positions of atomic columns in a transmission electron microscope image

Zhang, Q., Jin, C.H., Xu, H.T., Zhang, L.Y., Ren, X.B., Ouyang, Y., Wang, X.J., Yue, X.J., Lin, F.
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Volume:
113
Language:
english
Journal:
Micron
DOI:
10.1016/j.micron.2018.06.016
Date:
October, 2018
File:
PDF, 1.42 MB
english, 2018
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