Simulation of fine focus time-of-flight Rutherford...

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Simulation of fine focus time-of-flight Rutherford backscattering spectrometry using TRIM backscattering data

Seidl, Albert, Abo, Satoshi, Takai, Mikio
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Language:
english
Journal:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
DOI:
10.1016/j.nimb.2018.06.022
Date:
July, 2018
File:
PDF, 1.06 MB
english, 2018
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