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[IEEE 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Granada (2018.3.19-2018.3.21)] 2018 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EUROSOI-ULIS) - Effect of Schottky barrier contacts on measured capacitances in tunnel-FETs
Farokhnejad, Atieh, Schwarz, Mike, Graef, Michael, Horst, Fabian, Iniguez, Benjamin, Lime, Francois, Kloes, AlexanderYear:
2018
Language:
english
DOI:
10.1109/ulis.2018.8354766
File:
PDF, 958 KB
english, 2018