Impact of contact resistance on the electrical properties of MoS 2 transistors at practical operating temperatures
Giannazzo, Filippo, Fisichella, Gabriele, Piazza, Aurora, Di Franco, Salvatore, Greco, Giuseppe, Agnello, Simonpietro, Roccaforte, FabrizioVolume:
8
Language:
english
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.8.28
Date:
January, 2017
File:
PDF, 3.11 MB
english, 2017