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A Study on the Hopping Nature of an Excess Tunnel Current in Heavily Doped Silicon p − n Junction Diodes at Cryogenic Temperatures
Borblik, V. L., Shwarts, Yu. M., Shwarts, M. M., Aleinikov, A. B.Language:
english
Journal:
Silicon
DOI:
10.1007/s12633-018-9923-z
Date:
June, 2018
File:
PDF, 745 KB
english, 2018