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[ASME ASME 2011 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference - Washington, DC, USA (August 28–31, 2011)] Volume 7: 5th International Conference on Micro- and Nanosystems; 8th International Conference on Design and Design Education; 21st Reliability, Stress Analysis, and Failure Prevention Conference - High Resolution Microscopy of SiO
Burson, Kristen M., Yamamoto, Mahito, Cullen, William G.Year:
2011
Language:
english
DOI:
10.1115/DETC2011-48737
File:
PDF, 405 KB
english, 2011