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Reliable Multi-Valued Conductance States in TaOx Memristors through Oxygen Plasma Assisted Electrode Deposition with In Situ Biased Conductance State TEM Analysis
Lee, Myoung-Jae, Park, Gyeong-Su, Seo, David H., Kwon, Sung Min, Lee, Hyeon-Jun, Kim, June-Seo, Jung, Minkyung, You, Chun-Yeol, Lee, Hyangsook, Kim, Hee-Goo, Pang, Su-been, Seo, Sunae, Hwang, HyunsangLanguage:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.8b09046
Date:
July, 2018
File:
PDF, 1.70 MB
english, 2018