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[IEEE 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC ) - Houston, TX, USA (2018.5.14-2018.5.17)] 2018 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) - Defect detection in plain weave fabrics by yarn tracking and fully convolutional networks
Weninger, Leon, Kopaczka, Marcin, Merhof, DoritYear:
2018
Language:
english
DOI:
10.1109/I2MTC.2018.8409546
File:
PDF, 3.40 MB
english, 2018