Measurement of the evanescent field using noncontact mode atomic force microscope
Masayuki Abe, Takayuki Uchihashi, Masahiro Ohta, Hitoshi Ueyama, Yasuhiro Sugawara, Seizo MoritaVolume:
4
Language:
english
Pages:
4
DOI:
10.1007/bf02931687
Date:
January, 1997
File:
PDF, 470 KB
english, 1997