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[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - A case study of ESD trigger circuit: Time-out and stability
Meng, Kuo-Hsuan, Moosa, Mohamed, Torres, Cynthia, Miller, JimYear:
2018
Language:
english
DOI:
10.1109/IRPS.2018.8353660
File:
PDF, 751 KB
english, 2018