Analysis and Modeling of Temperature and Bias Dependence of...

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IEEE Transactions on Electron Devices 2018

Analysis and Modeling of Temperature and Bias Dependence of Current Mismatch in Halo-Implanted MOSFETs

Gupta, Chetan, Dey, Sagnik, Agarwal, Harshit, Goel, Ravi, Hu, Chenming, Chauhan, Yogesh Singh
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Year:
2018
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2018.2853989
File:
PDF, 2.64 MB
english, 2018
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