Photoreflectance Spectroscopy Study of LT-GaAs Layers Grown...

Semiconductors 2018 / 7 Vol. 52; Iss. 7

Photoreflectance Spectroscopy Study of LT-GaAs Layers Grown on Si and GaAs Substrates

Avakyants, L. P., Bokov, P. Yu., Kazakov, I. P., Bazalevsky, M. A., Deev, P. M., Chervyakov, A. V.
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Volume:
52
Language:
english
Journal:
Semiconductors
DOI:
10.1134/s1063782618070023
Date:
July, 2018
File:
PDF, 286 KB
english, 2018
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