Method for evaluating interfacial resistances of...

Measurement 2018 / 12 Vol. 129

Method for evaluating interfacial resistances of thermoelectric devices using I-V measurement

Kim, Dong Hwan, Kim, Cham, Kim, Jong Tae, Yoon, Duck Ki, Kim, Hoyoung
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Volume:
129
Language:
english
Journal:
Measurement
DOI:
10.1016/j.measurement.2018.07.030
Date:
December, 2018
File:
PDF, 1.16 MB
english, 2018
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