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Use of a New Imaging Technique to Document Deformations Recorded in the Environmental Scanning Electron Microscope
O'Neil, Edward F., Jennings, Hamlin M., Thomas, Jeffrey J.Volume:
11
Language:
english
Journal:
Microscopy Today
DOI:
10.1017/S1551929500052652
Date:
June, 2003
File:
PDF, 21.42 MB
english, 2003