Very low-frequency measurements of flicker noise in silicon...

Electronics Letters 1966 Vol. 2; Iss. 9

Very low-frequency measurements of flicker noise in silicon planar transistors

Martin, J.C., Mateu-Perez, F.X., Serra-Mestres, F.
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Volume:
2
Year:
1966
Language:
english
Journal:
Electronics Letters
DOI:
10.1049/el:19660290
File:
PDF, 417 KB
english, 1966
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