Classification of three-level Random Telegraph Noise and Its application in Accurate Extraction of Trap Profiles in Oxide-Based Resistive Switching Memory
Gong, Tiancheng, Luo, Qing, Xu, Xiaoxin, Yu, Jie, Dong, Danian, Lv, Hangbing, Yuan, Peng, Chen, Chuanbing, Yin, Jiahao, Tai, Lu, Zhu, Xi, Liu, Qi, Long, Shibing, Liu, MingYear:
2018
Language:
english
Journal:
IEEE Electron Device Letters
DOI:
10.1109/LED.2018.2858245
File:
PDF, 367 KB
english, 2018
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