Accelerated aging test and life expectancy of reduced-wall...

IEEE Transactions on Dielectrics and Electrical Insulation 2018 / 6 Vol. 25; Iss. 3

Accelerated aging test and life expectancy of reduced-wall high-stress MV TRXLPE cables

Dang, Chinh, Cote, Jacques, Leblanc, Pierre-Marc, Temple, William, Caronia, Paul
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Volume:
25
Language:
english
Journal:
IEEE Transactions on Dielectrics and Electrical Insulation
DOI:
10.1109/TDEI.2018.006856
Date:
June, 2018
File:
PDF, 2.01 MB
english, 2018
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