Nondestructive Failure Analysis and Simulation of...

Nondestructive Failure Analysis and Simulation of Encapsulated 0402 Multilayer Ceramic Chip Capacitors Under Thermal and Mechanical Loading

Wunderle, B., Braun, T., May, D., Michel, B., Reichl, H.
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Volume:
131
Year:
2009
Language:
english
Journal:
Journal of Electronic Packaging
DOI:
10.1115/1.3078187
File:
PDF, 654 KB
english, 2009
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