Effect of Technology Scaling on MOS Transistor Performance...

MRS Proceedings 2002 Vol. 716

Effect of Technology Scaling on MOS Transistor Performance with High-K Gate Dielectrics

Mohapatra, Nihar R., Desai, Madhav P., Narendra, Siva G., Rao, V. Ramgopal
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Volume:
716
Year:
2002
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/PROC-716-B3.3
File:
PDF, 123 KB
english, 2002
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