Update of Single Event Effects Radiation Hardness Assurance...

Sensors 2018 / 07 Vol. 18; Iss. 7

Update of Single Event Effects Radiation Hardness Assurance of Readout Integrated Circuit of Infrared Image Sensors at Cryogenic Temperature

Artola, Laurent, Youssef, Ahmad, Ducret, Samuel, Perrier, Franck, Buiron, Raphael, Gilard, Olivier, Mekki, Julien, Boutillier, Mathieu, Hubert, Guillaume, Poivey, Christian
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Volume:
18
Language:
english
Journal:
Sensors
DOI:
10.3390/s18072338
Date:
July, 2018
File:
PDF, 2.53 MB
english, 2018
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