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SAE Technical Paper Series [SAE International SAE 2003 World Congress & Exhibition - (MAR. 03, 2003)] SAE Technical Paper Series - Reliability Analysis of a Large Computational Model Using Polynomial Chaos Expansion
Choi, Seung-Kyum, Grandhi, Ramana V., Canfield, Robert A.Volume:
1
Year:
2003
Language:
english
DOI:
10.4271/2003-01-0465
File:
PDF, 197 KB
english, 2003