[IEEE 2018 17th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - San Diego, CA, USA (2018.5.29-2018.6.1)] 2018 17th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) - Temperature and Stress Metrology of Ultra-Wide Bandgap β-Ga2O3 Thin Films
Chatterjee, Bikramjit, Leach, Jacob H., Dhar, Sarit, Choi, SukwonYear:
2018
DOI:
10.1109/ITHERM.2018.8419526
File:
PDF, 1003 KB
2018