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Mid Infrared Instrument cooler subsystem test facility overview
Moore, B, Zan, J, Hannah, B, Chui, T, Penanen, K, Weilert, MVolume:
278
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899X/278/1/012006
Date:
December, 2017
File:
PDF, 1.53 MB
2017