[IEEE 2018 Annual American Control Conference (ACC) -...

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[IEEE 2018 Annual American Control Conference (ACC) - Milwaukee, WI, USA (2018.6.27-2018.6.29)] 2018 Annual American Control Conference (ACC) - Direct Design of Closed-loop Demodulators for Amplitude Modulation Atomic Force Microscopy

Ruppert, Michael G., Harcombe, David M., Moore, Steven I., Fleming, Andrew J.
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Year:
2018
DOI:
10.23919/ACC.2018.8430896
File:
PDF, 814 KB
2018
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