[IEEE 2018 Annual American Control Conference (ACC) -...

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[IEEE 2018 Annual American Control Conference (ACC) - Milwaukee, WI, USA (2018.6.27-2018.6.29)] 2018 Annual American Control Conference (ACC) - Model Reduction in Linear Parameter-Varying Models using Autoencoder Neural Networks

Rizvi, Syed Z., Abbasi, Farshid, Velni, Javad Mohammadpour
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Year:
2018
DOI:
10.23919/ACC.2018.8431912
File:
PDF, 822 KB
2018
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