Electron Dose Management for High Angle Annular Dark Field Scanning Transmission Electron Microscope Tomography of Beam Sensitive Materials
Voisard, Frédéric, Demers, Hendrix, Trudeau, Michel, Demopoulos, George P., Gauvin, Raynald, Zaghib, KarimVolume:
22
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927616007315
Date:
July, 2016
File:
PDF, 1.05 MB
2016