An Ensemble of Component-Based and Population-Based...

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IEEE Transactions on Reliability 2018

An Ensemble of Component-Based and Population-Based Self-Organizing Maps for the Identification of the Degradation State of Insulated-Gate Bipolar Transistors

Rigamonti, Marco, Baraldi, Piero, Alessi, Allegra, Zio, Enrico, Astigarraga, Daniel, Galarza, Ainhoa
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Year:
2018
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/TR.2018.2834828
File:
PDF, 799 KB
2018
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