[IEEE 2018 Annual American Control Conference (ACC) -...

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[IEEE 2018 Annual American Control Conference (ACC) - Milwaukee, WI, USA (2018.6.27-2018.6.29)] 2018 Annual American Control Conference (ACC) - Unification of an empirical and a physically-based approach to crystallization monitoring

Kim, Youngjo, Dean, Kayla C., Kawajiri, Yoshiaki, Rousseau, Ronald W., Grover, Martha A.
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Year:
2018
DOI:
10.23919/ACC.2018.8430977
File:
PDF, 577 KB
2018
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