Probing three-dimensional surface force fields with atomic...

Beilstein Journal of Nanotechnology 2012 / 09 Vol. 3

Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reduction

Baykara, Mehmet Z, Dagdeviren, Omur E, Schwendemann, Todd C, Mönig, Harry, Altman, Eric I, Schwarz, Udo D
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Volume:
3
Journal:
Beilstein Journal of Nanotechnology
DOI:
10.3762/bjnano.3.73
Date:
September, 2012
File:
PDF, 8.54 MB
2012
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