Fast estimation of channel temperature in GaN high electron...

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Semiconductor Science and Technology 2018 / 07

Fast estimation of channel temperature in GaN high electron mobility transistor under rf operating conditions

Chervonni, Boris, Aktushev, Oleg, Ojalvo, Efi, Knafo, Yaron, Turkulets, Yury, Shalish, Ilan
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Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/aad539
Date:
July, 2018
File:
PDF, 609 KB
english, 2018
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