![](/img/cover-not-exists.png)
Markov random field segmentation for industrial computed tomography with metal artefacts
Jaiswal, Avinash, Williams, Mark A., Bhalerao, Abhir., Tiwari, Manoj K., Warnett, Jason M.Language:
english
Journal:
Journal of X-Ray Science and Technology
DOI:
10.3233/XST-17322
Date:
March, 2018
File:
PDF, 1.26 MB
english, 2018