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SAE Technical Paper Series [SAE International 22nd SAE Brasil International Congress and Display - (OCT. 07, 2013)] SAE Technical Paper Series - An Overview of an Assurance Process of Immunity of Embedded Electronic Systems to Single Event Upsets Caused by Ionizing Particles
Machado, Sérgio Roberto Ferreira, de Oliveira e Souza, Marcelo LopesVolume:
1
Year:
2013
Language:
english
DOI:
10.4271/2013-36-0535
File:
PDF, 1.02 MB
english, 2013