SAE Technical Paper Series [SAE International SAE 2016 World Congress and Exhibition - (APR. 12, 2016)] SAE Technical Paper Series - APP-Based Diagnostics of E/E Systems with ISO Standardized Technology (MVCI, ODX, OTX, and UDS on DoIP)
Subke, Peter, Moshref, MuzafarVolume:
1
Year:
2016
Language:
english
DOI:
10.4271/2016-01-0073
File:
PDF, 902 KB
english, 2016