[IEEE 2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Noida, India (2017.9.20-2017.9.22)] 2017 6th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Impact of development methodology on cost & risk for development projects
Dayal Chauhan, Bishan, Rana, Ajay, Sharma, Neeraj KumarYear:
2017
Language:
english
DOI:
10.1109/ICRITO.2017.8342436
File:
PDF, 297 KB
english, 2017