Variance-Based Iterative Model Order Reduction of Equivalent Circuits for EMC Analysis
Yildiz, Omer Faruk, Bruns, Heinz-Dietrich, Schuster, ChristianYear:
2018
Language:
english
Journal:
IEEE Transactions on Electromagnetic Compatibility
DOI:
10.1109/TEMC.2018.2845676
File:
PDF, 1.97 MB
english, 2018