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[IEEE 2017 36th Chinese Control Conference (CCC) - Dalian, China (2017.7.26-2017.7.28)] 2017 36th Chinese Control Conference (CCC) - Simultaneous classification and feature selection via LOG SVM and Elastic LOG SVM
Liu, Jian-wei, Li, Shuang-Cheng, Cui, Li-peng, Luo, Xiong-linYear:
2017
Language:
english
DOI:
10.23919/ChiCC.2017.8029116
File:
PDF, 211 KB
english, 2017