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[IEEE 2009 European Control Conference (ECC) - Budapest (2009.8.23-2009.8.26)] 2009 European Control Conference (ECC) - Pattern recognition for holonic manufacturing systems
Ferariu, L., Panescu, D.Year:
2009
Language:
english
DOI:
10.23919/ECC.2009.7074578
File:
PDF, 217 KB
english, 2009