ToF-SIMS analysis of an organic layer using toluene and its...

Applied Surface Science 2018 / 11 Vol. 458

ToF-SIMS analysis of an organic layer using toluene and its cluster ion beam projectiles generated by multiphoton ionization

Choi, Chang Min, Lee, Sang Ju, Baek, Ji Young, Kim, Jeong Jin, Choi, Myoung Choul
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Volume:
458
Language:
english
Journal:
Applied Surface Science
DOI:
10.1016/j.apsusc.2018.07.157
Date:
November, 2018
File:
PDF, 860 KB
english, 2018
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