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SAE Technical Paper Series [SAE International SAE 2005 World Congress & Exhibition - (APR. 11, 2005)] SAE Technical Paper Series - Next Generation Test Automation
Anhalt, Christopher, Lebert, Klaus, Tränkle, FrankVolume:
1
Year:
2005
Language:
english
DOI:
10.4271/2005-01-1040
File:
PDF, 322 KB
english, 2005