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SAE Technical Paper Series [SAE International SAE 2005 World Congress & Exhibition - (APR. 11, 2005)] SAE Technical Paper Series - A Comparative Study of Bayesian-Based Reliability Prediction Methodologies
Itabashi-Campbell, Rachel, Goel, Parveen S., Yadav, Om P.Volume:
1
Year:
2005
Language:
english
DOI:
10.4271/2005-01-1777
File:
PDF, 171 KB
english, 2005