SAE Technical Paper Series [SAE International SAE World...

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SAE Technical Paper Series [SAE International SAE World Congress & Exhibition - (APR. 16, 2007)] SAE Technical Paper Series - Quality Loss Function - Common Methodology for Nominal-The-Best, Smaller-The-Better, and Larger-The-Better Cases

Sharma, Naresh Kumar, Ragsdell, Kenneth M.
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Volume:
1
Year:
2007
Language:
english
DOI:
10.4271/2007-01-0797
File:
PDF, 183 KB
english, 2007
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