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SAE Technical Paper Series [SAE International SAE 2013 World Congress & Exhibition - (APR. 16, 2013)] SAE Technical Paper Series - The Uncertainty of Estimated Lognormal and Weibull Parameters for Test Data with Small Sample Size
Wei, Zhigang, Yang, Fulun, Luo, Limin, Lin, ShengbinVolume:
1
Year:
2013
Language:
english
DOI:
10.4271/2013-01-0945
File:
PDF, 2.12 MB
english, 2013