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Study on related simulations between exit characteristics and evacuation performance
Chiu, Yung-Piao, Shiau, Yan-Chyuan, Lai, Yi-HsuanLanguage:
english
Journal:
Microsystem Technologies
DOI:
10.1007/s00542-018-4063-3
Date:
July, 2018
File:
PDF, 616 KB
english, 2018