Laser-Induced Fault Injection on Smartphone Bypassing the Secure Boot
Vasselle, Aurelien, Thiebeauld, Hugues, Maouhoub, Quentin, Morisset, Adele, Ermeneux, SebastienYear:
2018
Language:
english
Journal:
IEEE Transactions on Computers
DOI:
10.1109/TC.2018.2860010
File:
PDF, 5.00 MB
english, 2018