Moiré method for nanometer instability investigation of...

Optics Express 2017 / 05 Vol. 25; Iss. 11

Moiré method for nanometer instability investigation of scanning hard x-ray microscopes

Vogt, Ulrich, Köhler, Daniel, Dickmann, Jannis, Rahomäki, Jussi, Parfeniukas, Karolis, Kubsky, Stefan, Alves, Filipe, Langlois, Florent, Engblom, Christer, Stankevič, Tomaš
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Volume:
25
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.25.012188
Date:
May, 2017
File:
PDF, 31.38 MB
english, 2017
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