On-wafer probing-kit for RF characterization of silicon...

Optics Express 2017 / 06 Vol. 25; Iss. 12

On-wafer probing-kit for RF characterization of silicon photonic integrated transceivers

Zhang, Shangjian, Zhang, Chong, Wang, Heng, Liu, Yong, Peters, Jon D., Bowers, John E.
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Volume:
25
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.25.013340
Date:
June, 2017
File:
PDF, 3.13 MB
english, 2017
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