Trade-offs between structural integrity and acquisition time in stochastic super-resolution microscopy techniques
Rupprecht, Jean-François, Martinez-Marrades, Ariadna, Zhang, Zhen, Changede, Rishita, Kanchanawong, Pakorn, Tessier, GillesVolume:
25
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.25.023146
Date:
September, 2017
File:
PDF, 2.42 MB
english, 2017