Artifact free time resolved near-field spectroscopy
Sternbach, A. J., Hinton, J., Slusar, T., McLeod, A. S., Liu, M. K., Frenzel, A., Wagner, M., Iraheta, R., Keilmann, F., Leitenstorfer, A., Fogler, M., Kim, H.-T., Averitt, R. D., Basov, D. N.Volume:
25
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.25.028589
Date:
November, 2017
File:
PDF, 4.35 MB
english, 2017