Interferometric synthetic aperture microscopy for extended focus optical coherence microscopy
Coquoz, Séverine, Bouwens, Arno, Marchand, Paul J., Extermann, Jérôme, Lasser, TheoVolume:
25
Language:
english
Journal:
Optics Express
DOI:
10.1364/oe.25.030807
Date:
November, 2017
File:
PDF, 5.44 MB
english, 2017